Chicago Materials Research Center


The Materials Preparation and Measurement Laboratory (MPML) provides facilities for preparation, fabrication, processing, patterning and characterization of many types of samples. Instrumentation encompasses scanning probe microscopes (AFM and STM), scanning electron microscopes (SEM), optical lithography and imaging, sample cutting-polishing, surface coating, thermal characterization, optical characterization via steady-state and time-resolved fluorescence, absorbance, reflectance, Raman, and light scattering. Please see below for more details about our tools:

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