Chicago Materials Research Center

SCANNING PROBE MICROSCOPY

Asylum Research Oxford Instruments Cypher ES AFM

Asylum Research Oxford Instruments Cypher ES AFM

Asylum Research Oxford Instruments Cypher ES AFM

The Cypher ES is a fast-scan AFM that acquires high-resolution images in seconds rather than minutes; thereby enabling dynamic AFM measurements in diverse active systems like lipid bilayers, polymerizing actin networks, nanoparticle membranes, and diblock copolymers. Our Cypher ES is equipped with multiple sample scanners for fast high-resolution imaging in almost any environment: air, fluid, perfusion, and heating/cooling from 0°C to 250°C. The Cypher ES also has conductive AFM, Kelvin Probe, and atomic-resolution femto-STM modes. The Cypher has quickly become one of our most popular and powerful AFMs.

Specifications

  • S and ES Scanners with 30um XY and 5um Z ranges
  • BlueDrive
  • Capable of imaging with atomic resolution
  • Scan rates > 10Hz
  • Sample sizes up to 15mm
  • Ergo AFM interface
  • Temperature stabilization to reduce thermal drift
  • Environmental control: Liquid Droplet, Liquid Perfusion, Inert Gas, Temperature from 0°C to 250°C
  • Standard modes: AC Tapping, Phase, Contact, Force Curves, LFM, MFM, Nanolithography, Dual-AC, DART
  • Electrical modes: ORCA Conductive AFM, KPFM, EFM, femto-amp STM, PFM
  • Nanomechanical modes: AM-FM Viscoelastic Mapping, Fast Force Mapping, Contact Resonance

Asylum Research Oxford Instruments MFP-3D-BIO AFM

Asylum Research Oxford Instruments MFP-3D-BIO AFM

Asylum Research Oxford Instruments MFP-3D-BIO AFM

The Asylum MFP-3D-BIO AFM is mounted on an inverted optical microscope to enable simultaneous brightfield, widefield epi-fluorescence, or phase imaging. The extended Z-head allows tapping mode and contact imaging within a range of 40µm in Z and 90µm in X and Y. It also is capable of nanomechanical property mapping, bimodal dual-AC imaging, single-molecule force extension measurements, conductive AFM, and STM. An open-access sample area and a range of environmental chambers (BioHeater, Petri Dish Holder, Heater/Cooler, and Polymer Heater) ensure compatibility for nearly any kind of sample (material, chemical, or biological) in air, fluid, or inert atmosphere. Excellent high-temperature (300°C) time-lapse imaging in inert atmospheres with minimal drift is a key advantage. A Scanning Electrochemical Microscopy cell was recently added.

Specifications

  • Scanner with 90um XY and 40um Z ranges
  • Sample sizes up to 50mm
  • Environmental control: Liquid Droplet, Liquid Perfusion, Inert Gas, Temperature from -20°C to 300°C
  • Standard modes: AC Tapping, Phase, Contact, Force Curves, LFM, MFM, Nanolithography, Dual-AC, DART
  • Electrical modes: ORCA Conductive AFM, KPFM, EFM, STM, PFM, SECM
  • Nanomechanical modes: Force Volume Mapping
  • Optical: Brightfield, Fluorescence, Phase

Bruker Multimode 8 AFM

Bruker Multimode 8 AFM

Bruker Multimode 8 AFM

Our Bruker Multimode 8 AFM is used most often for imaging and material property measurements with ScanAsyst, Peak Force Tapping, and Peak Force QNM (Quantitative Nanomechanical Property Measurement) modes. Multiple J, E and A scanners are available as well as electrical, magnetic, nanomechanical, and environmental capabilities.

Specifications

  • Nanoscope V controller
  • J, E, and A scanners
  • Sample sizes up to 10mm
  • Environmental control: Liquid Cell
  • Standard modes: PeakForce Tapping, ScanAsyst, AC Tapping, Phase, Contact, Force Curves, LFM, MFM
  • Electrical modes: Conductive AFM, EFM, STM
  • Nanomechanical modes: PeakForce-QNM, Force Volume Mapping

Bruker Multimode 5 AFM

Bruker Multimode 5 AFM

Bruker Multimode 5 AFM

Our Bruker Multimode 5 AFM is used most often for routine tapping mode imaging and basic AFM training. Multiple J, E and A scanners are available as well.

Specifications

  • Nanoscope IIIa controller
  • J, E, and A scanners
  • Sample sizes up to 10mm
  • Environmental control: Liquid Cell
  • Standard modes: AC Tapping, Phase, Contact, Force Curves, LFM, MFM
  • Electrical modes: Conductive AFM, EFM, STM
  • Nanomechanical modes: Force Volume Mapping

Bruker MS-10 STM

Bruker MS-10 STM

Bruker MS-10 STM

Our Bruker MS-10 Standalone STM provides high sensitivity and high stability STM imaging with atomic resolution at low tunneling currents. A custom-built automated Pt/Ir tip etching system is nearby, so that STM tips can be freshly made when necessary.

Specifications

  • Nanoscope IIIa controller
  • pA imaging setpoints
  • Atomic resolution
  • Air and liquid environments
  • Sample sizes up to 10mm
  • Custom tip etcher
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